Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1792014 | Journal of Crystal Growth | 2012 | 4 Pages |
Fe and Fe3O4 thin films were grown by radio frequency magnetron sputtering. Fe2O3 was used as the target and hydrogen was introduced together with Argon gas to provide a certain reducing atmosphere. By varying H2/Ar flow ratio, the changes in composition and structure of the thin films from (110) Fe to (111) Fe3O4 were observed by X-ray diffraction. The valence states of Fe in the thin films were analyzed by X-ray photoelectron spectroscopy. Magnetization measurements indicate that the Fe thin films grown with low H2/Ar flow ratios possess large coercive force. It was ascribed to the increasing boundary density and the increasing amount of Fe oxides such as FeO distributed at the boundary.
► (110) Fe and (111) Fe3O4 thin films were grown by magnetron sputtering with Fe2O3 target. ► H2 was introduced to provide a reducing ambient.► The coercive force of Fe thin films increases with the decreasing H2/Ar flux ratio.