Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1792234 | Journal of Crystal Growth | 2011 | 5 Pages |
Abstract
Surface diffusion kinetics plays a major role in the growth of III–V nanowires by the molecular beam epitaxial (MBE) technique. As/In flux is one of the key factors in determining the diffusion length, which eventually affect the growth rate, morphology and length of the InAs nanowire. To identify a better growth condition and to attain a maximum growth rate and longer diffusion length, a systematic analysis has been carried out on the growth of InAs nanowire by varying In- and As-flux. The results have shown that the growth rate and length of the nanowires can be improved to a maximum of 3.8 nm/s and 14 μm, respectively, which is found to be the maximum by the MBE technique in the available reports.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
J. Bubesh Babu, Kanji Yoh,