| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 1792466 | Journal of Crystal Growth | 2011 | 6 Pages | 
Abstract
												High aspect ratio silicon wire arrays with excellent pattern fidelity over wafer-scale area were grown by chemical vapor deposition at moderate temperature, using a gas mixture of silane and hydrogen chloride. An innovative two-step process was developed for in situ doping of silicon wires by diborane. This process led to high p-type doping levels, up to 1018–1019 cm−3, without degradation of the silicon wire array pattern fidelity.
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											Authors
												Christine Morin, David Kohen, Vasiliki Tileli, Pascal Faucherand, Michel Levis, Arnaud Brioude, Bassem Salem, Thierry Baron, Simon Perraud, 
											