Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1792466 | Journal of Crystal Growth | 2011 | 6 Pages |
Abstract
High aspect ratio silicon wire arrays with excellent pattern fidelity over wafer-scale area were grown by chemical vapor deposition at moderate temperature, using a gas mixture of silane and hydrogen chloride. An innovative two-step process was developed for in situ doping of silicon wires by diborane. This process led to high p-type doping levels, up to 1018–1019 cm−3, without degradation of the silicon wire array pattern fidelity.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Christine Morin, David Kohen, Vasiliki Tileli, Pascal Faucherand, Michel Levis, Arnaud Brioude, Bassem Salem, Thierry Baron, Simon Perraud,