Some physical investigations on ZnS1−xSex films obtained by selenization of ZnS sprayed films using the Boubaker polynomials expansion scheme

ZnS1−xSex thin films have been grown by selenization process, applied to ZnS sprayed thin films deposited on Pyrex glass substrates at 550 °C. The crystal structure and surface morphology were investigated by the XRD technique and by the atomic force microscopy. This structural study shows that selenium-free (x=0) ZnS thin films, prepared at substrate temperature TS=450 °C, were well crystallized in cubic structure and oriented preferentially along (1 1 1) direction. The thermal and mechanical properties were also investigated using a photothermal protocol along with Vickers hardness measurements. On the other hand, the analyze of the transmittance T(λ) and the reflectance R(λ), optical measurements of these films depicts a decrease in the band gap energy value Eg with an increase in Se content (x). Indeed, Eg values vary from 3.6 to 3.1 eV.