Article ID Journal Published Year Pages File Type
1793370 Journal of Crystal Growth 2009 6 Pages PDF
Abstract
Epitaxial (0 0 1)-oriented films of the metallic oxide (Ba1−ySry)Ti0.5Nb0.5O3, with y=0, 0.4, 0.5 and 0.6, are deposited onto (0 0 1) MgAl2O4 substrates using the pulsed laser deposition technique. The strontium for barium substitution gives rise to a decrease in the lattice constant, without altering the conductivity of the film. X-ray diffraction measurements show a significant number of [1 1 1], [0 1 1] and [2 2 1] misoriented grains that are not present for the y=0.6 composition. Transmission electron microscopy images of the film-substrate interface obtained for the y=0.6 composition show a sharp interface with flawless epitaxy. We attribute the improvements to a decrease in the lattice misfit strain made possible through the superior lattice match to the substrate obtained through strontium substitution.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Authors
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