Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1793370 | Journal of Crystal Growth | 2009 | 6 Pages |
Abstract
Epitaxial (0Â 0Â 1)-oriented films of the metallic oxide (Ba1âySry)Ti0.5Nb0.5O3, with y=0, 0.4, 0.5 and 0.6, are deposited onto (0Â 0Â 1) MgAl2O4 substrates using the pulsed laser deposition technique. The strontium for barium substitution gives rise to a decrease in the lattice constant, without altering the conductivity of the film. X-ray diffraction measurements show a significant number of [1Â 1Â 1], [0Â 1Â 1] and [2Â 2Â 1] misoriented grains that are not present for the y=0.6 composition. Transmission electron microscopy images of the film-substrate interface obtained for the y=0.6 composition show a sharp interface with flawless epitaxy. We attribute the improvements to a decrease in the lattice misfit strain made possible through the superior lattice match to the substrate obtained through strontium substitution.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Y. Shao, R.A. Hughes, A. Dabkowski, J.F. Britten, S. Lazar, J.S. Preston, G.A. Botton,