Article ID Journal Published Year Pages File Type
1793401 Journal of Crystal Growth 2010 4 Pages PDF
Abstract

Single-phase Zn0.95−xCuxLi0.05O thin films have been prepared on Pt (1 1 1)/Ti/SiO2 substrates by reactive magnetron sputtering method. The XRD, XPS and absorption measurements confirmed the polycrystalline nature of the films and the substitution of Zn2+ by Cu2+ ions. The sputtered Zn0.90Cu0.05Li0.05O film shows multiferroic properties exhibiting a saturated ferroelectric loop with a remanent polarization of 6 μC/cm2 and a saturated loop with a saturation magnetization of 0.43 μB/Cu at room temperature. The origins of the ferromagnetism and ferroelectricity in these films are discussed.

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Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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