Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1793401 | Journal of Crystal Growth | 2010 | 4 Pages |
Abstract
Single-phase Zn0.95−xCuxLi0.05O thin films have been prepared on Pt (1 1 1)/Ti/SiO2 substrates by reactive magnetron sputtering method. The XRD, XPS and absorption measurements confirmed the polycrystalline nature of the films and the substitution of Zn2+ by Cu2+ ions. The sputtered Zn0.90Cu0.05Li0.05O film shows multiferroic properties exhibiting a saturated ferroelectric loop with a remanent polarization of 6 μC/cm2 and a saturated loop with a saturation magnetization of 0.43 μB/Cu at room temperature. The origins of the ferromagnetism and ferroelectricity in these films are discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
C.W. Zou, H.J. Wang, M.L. Yin, M. Li, C.S. Liu, L.P. Guo, D.J. Fu, T.W. Kang,