Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1793694 | Journal of Crystal Growth | 2009 | 4 Pages |
Abstract
Single crystals of tetra thiourea cobalt chloride (TTCoC) having dimension of 25 mm×24 mm×7 mm were grown by slow evaporation solution growth technique. The structural perfection of the grown crystals was analyzed by high-resolution X-ray diffraction (HRXRD). The mechanical property of the grown crystals has been analyzed by Vicker's microhardness method. The dielectric constant measurements were carried out and the nature of variation of dielectric constant εr and dielectric loss D were studied and reported.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
G. Senthil Murugan, P. Ramasamy,