Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1793745 | Journal of Crystal Growth | 2009 | 4 Pages |
Abstract
Zn3As2 layers grown by liquid phase epitaxy (LPE) on InAs(1Â 1Â 0) substrates have been irradiated with 100Â MeV Ni9+ ions. Irradiation was performed at liquid nitrogen temperature (77Â K) with different ion fluences of 1Ã1010, 1Ã1011, 1Ã1012 and 1Ã1013Â ions/cm2. The structural, electrical and optical properties of the as-grown and Ni9+ ion-irradiated epilayers were studied by X-ray diffraction (XRD), high-resolution X-ray rocking curve (HRXRD), infrared (IR) optical absorption and Hall measurements. XRD pattern revealed the presence of buried nickel layer between the epilayer and the substrate at the highest fluence of irradiation and the same has been confirmed by cross-sectional scanning electron microscopy and energy-dispersive X-ray microanalysis. IR optical absorption spectra showed a decrease in the bandgap of the epilayers from 1.0 to 0.93Â eV on increasing the fluence of irradiation. The unintentionally doped as-grown p-type epilayers changed to n-type due to Ni9+ ion irradiation at the highest fluence of irradiation with the increase of ion fluence.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
S. Sudhakar, K. Baskar,