| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1794488 | Journal of Crystal Growth | 2009 | 4 Pages |
Abstract
Coarse and fine TiB whiskers were formed during the reaction synthesized TiB reinforced Ti matrix composites. The microstructure of the as-synthesized TiB whiskers has been investigated by TEM and HREM. Dislocations and stacking faults were observed in the coarse TiB whiskers, and only high-density stacking faults presented in the fine TiB whiskers. The formation of dislocations is related to the stacking faults, the formation mechanism and atomic structure of dislocations in the in situ synthesized TiB whiskers was suggested.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Qingchang Meng, Haibo Feng, Guangchang Chen, Ronghai Yu, Dechang Jia, Yu Zhou,