Article ID Journal Published Year Pages File Type
1794816 Journal of Crystal Growth 2008 6 Pages PDF
Abstract

La2Zr2O7 (LZO) buffer layers have been prepared on Ni-5 at%W tapes using chemical solution deposition. The local texture of the deposited layers has been studied throughout the thickness using ion-beam sputtering and electron back-scattering diffraction (EBSD). The processing conditions have been optimised afterwards based on these results leading to a highly textured surface for annealing temperatures of 1050 °C. YBa2Cu3O7−x layers were deposited by pulsed laser deposition on these single LZO buffer layers and studied in detail using X-ray diffraction and EBSD. A close correlation was found between the surface texture and the superconducting properties.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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