Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1794816 | Journal of Crystal Growth | 2008 | 6 Pages |
Abstract
La2Zr2O7 (LZO) buffer layers have been prepared on Ni-5 at%W tapes using chemical solution deposition. The local texture of the deposited layers has been studied throughout the thickness using ion-beam sputtering and electron back-scattering diffraction (EBSD). The processing conditions have been optimised afterwards based on these results leading to a highly textured surface for annealing temperatures of 1050 °C. YBa2Cu3O7−x layers were deposited by pulsed laser deposition on these single LZO buffer layers and studied in detail using X-ray diffraction and EBSD. A close correlation was found between the surface texture and the superconducting properties.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
S. Engel, R. Hühne, K. Knoth, A. Chopra, N.H. Kumar, V.S. Sarma, P.N. Santhosh, L. Schultz, B. Holzapfel,