Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1794849 | Journal of Crystal Growth | 2009 | 4 Pages |
Abstract
We report the experimental determination of the interband deformation potentials of indium nitride by combining both optical spectroscopy investigations and high-resolution X-ray measurements performed on a series of InN films grown by metal organic vapour-phase epitaxy. Our approach, which follows the one used for GaN by Shan et al. [Phys. Rev. B. 54 (1996) 13460], gives here for InN a1=−7.66 eV, a2=−2.59 eV, b1=5.06 eV, and b2=−2.53 eV.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
B. Gil, M. Moret, O. Briot, S. Ruffenach, Ch. Giesen, M. Heuken, S. Rushworth, T. Leese, M. Succi,