Article ID Journal Published Year Pages File Type
1794907 Journal of Crystal Growth 2009 4 Pages PDF
Abstract

An in-situ optical monitoring system made in our laboratory is set up on the horizontal hydride vapor phase epitaxy (HVPE) equipment. From the growth rate information provided by this system, some basic growth parameters are optimized and high-quality GaN layers are grown. The growth stress of the HVPE GaN layer grown on different templates is also examined through the in-situ optical measuring.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Authors
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