Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1794907 | Journal of Crystal Growth | 2009 | 4 Pages |
Abstract
An in-situ optical monitoring system made in our laboratory is set up on the horizontal hydride vapor phase epitaxy (HVPE) equipment. From the growth rate information provided by this system, some basic growth parameters are optimized and high-quality GaN layers are grown. The growth stress of the HVPE GaN layer grown on different templates is also examined through the in-situ optical measuring.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
J.F. Wang, X.J. Hu, Y.M. Zhang, Y. Xu, H.B. Wang, B.S. Zhang, K. Xu, H. Yang,