Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1794960 | Journal of Crystal Growth | 2007 | 5 Pages |
Abstract
Metastable cubic tantalum nitride (TaN) nanocrystals have been firstly direct synthesized by dc arc discharge and characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR) techniques. The average grain size of cubic TaN nanocrystals is about 5–10 nm. The influence of N2 pressure on the as-synthesized metastable cubic TaN is studied and it is found that lower N2 pressure is favorable for the formation of metastable cubic TaN. The growth mechanism of metastable cubic TaN was discussed. This method may be suitable for a direct preparation for mass production of TaN nanocrystals.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Weiwei Lei, Dan Liu, Longhai Shen, Jian Zhang, Pinwen Zhu, Qiliang Cui, Guangtian Zou,