Article ID Journal Published Year Pages File Type
1794960 Journal of Crystal Growth 2007 5 Pages PDF
Abstract

Metastable cubic tantalum nitride (TaN) nanocrystals have been firstly direct synthesized by dc arc discharge and characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared (FTIR) techniques. The average grain size of cubic TaN nanocrystals is about 5–10 nm. The influence of N2 pressure on the as-synthesized metastable cubic TaN is studied and it is found that lower N2 pressure is favorable for the formation of metastable cubic TaN. The growth mechanism of metastable cubic TaN was discussed. This method may be suitable for a direct preparation for mass production of TaN nanocrystals.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Authors
, , , , , , ,