Article ID Journal Published Year Pages File Type
1795085 Journal of Crystal Growth 2007 6 Pages PDF
Abstract

The thermal stabilities of Al- and N-polarity AlN layers grown on (0 0 0 1) sapphire substrates were investigated at temperatures ranging from 1100 to 1400 °C in various gas flows (He, H2 and H2+NH3). Decomposition of AlN occurred in flowing H2, while it did not occur in He or H2+NH3 flow. The decomposition rate in H2 increased with an increase in the temperature over 1200 °C, and the decomposition rate of the Al-polarity AlN layer was found to be lower than that of the N-polarity AlN layer at each temperature. The decomposition reaction of AlN and the relationship between the polarities of the AlN layers and their different decomposition rates are discussed.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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