Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1795085 | Journal of Crystal Growth | 2007 | 6 Pages |
Abstract
The thermal stabilities of Al- and N-polarity AlN layers grown on (0 0 0 1) sapphire substrates were investigated at temperatures ranging from 1100 to 1400 °C in various gas flows (He, H2 and H2+NH3). Decomposition of AlN occurred in flowing H2, while it did not occur in He or H2+NH3 flow. The decomposition rate in H2 increased with an increase in the temperature over 1200 °C, and the decomposition rate of the Al-polarity AlN layer was found to be lower than that of the N-polarity AlN layer at each temperature. The decomposition reaction of AlN and the relationship between the polarities of the AlN layers and their different decomposition rates are discussed.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Yoshinao Kumagai, Kazuhiro Akiyama, Rie Togashi, Hisashi Murakami, Misaichi Takeuchi, Toru Kinoshita, Kazuya Takada, Yoshinobu Aoyagi, Akinori Koukitu,