| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1795452 | Journal of Crystal Growth | 2008 | 5 Pages |
Abstract
A significant lattice deformation associated with striation was revealed with some of the synchrotron topographic methods, particularly back-reflection white beam topography with fine mesh placed behind the crystal and transmission synchrotron section topography, where a characteristic bending of the section image was observed. The transmission section topographs provided also good visibility of segregation fringes in the plane intersected by the beam, corresponding to the subsequent positions of the growth surface.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
A. Malinowska, M. Lefeld-Sosnowska, K. Wieteska, W. Wierzchowski, W. Graeff, A. Pajaczkowska,