| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1795573 | Journal of Crystal Growth | 2008 | 4 Pages |
Abstract
The epitaxial relationships of vapor-deposited thin films of pentacene on anthracene single crystal were investigated by X-ray diffractometry. The in-plane and out-of-plane structures of the thin films were investigated using a four-axis X-ray diffractometer. The thin-film phase of pentacene was confirmed in the deposited films, and the epitaxial relationship was determined. Uniaxial in-plane orientation was observed as well as the orientation of substrate normal direction. The mechanism of epitaxy is discussed in terms of lattice matching in [1Â 1Â 0] direction.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Noriyuki Yoshimoto, Toshiyuki Kakudate, Keijyu Aosawa, Yoshio Saito,