Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1795607 | Journal of Crystal Growth | 2007 | 5 Pages |
Abstract
The successful molecular beam epitaxial growth of single crystalline ScxEr1−xSb compounds on InAs(1 0 0) substrates has been demonstrated. Ex situ high-resolution X-ray diffraction and Rutherford backscattering spectrometry with ion channeling studies indicate high crystalline quality. The surface reconstruction was monitored in situ by reflection high-energy electron diffraction (RHEED) during the growth and low-energy electron diffraction post growth. The ScxEr1−xSb(1 0 0) surface exhibited a mixed (1×4)/(4×1) reconstruction. The RHEED patterns and the RHEED intensity oscillations during the growth are consistent with an embedded growth mechanism for the initial ScxEr1−xSb growth on InAs.
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Authors
S.G. Choi, B.D. Schultz, Y.Q. Wang, C.J. Palmstrøm,