X-ray photoemission electron microscopy study of the in-plane spin reorientation transitions in epitaxial Fe films on W(110)

•Time and space evolution of the reorientations is revealed using the XMCD contrast.•The thickness and temperature induced transitions involve different mechanisms.•The thickness-induced reorientation is strongly influenced by defects.•After the thickness-induced transition the sample is in the single domain state.

The thickness- and temperature-induced in-plane spin reorientation transitions (SRT) in epitaxial Fe films on a W(110) single crystal were investigated using X-ray photoemission electron microscopy. We present the real time evolution of the magnetisation switching, and we demonstrate differences between the two transition mechanisms. Whereas both the transitions involve the magnetic domain wall motion, the temperature SRT is additionally accompanied by nucleation of domains. Before and after the thickness-induced SRTs, the sample is in the almost single domain state, which is not the case for the final magnetic configuration after the temperature-induced transition.