| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1800261 | Journal of Magnetism and Magnetic Materials | 2012 | 7 Pages |
Abstract
⺠An improved magnetic transverse susceptibility measurement equipment is presented. ⺠The electronics of the equipment are redesigned by using CMOS transistors. ⺠Minimal thermal leak of the probe is obtained allowing to measure from 1.8 K. ⺠The sensitivity of the equipment is 10â6 emu at low temperatures. ⺠The data acquisition sequences are implemented in the PPMS MultiVu software.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
A.I. Figueroa, J. Bartolomé, J.M. GarcÃa del Pozo, A. Arauzo, E. Guerrero, P. Téllez, F. Bartolomé, L.M. GarcÃa,