Article ID Journal Published Year Pages File Type
1800431 Journal of Magnetism and Magnetic Materials 2011 4 Pages PDF
Abstract

Features in the formation of chemically deposited polycrystalline Co–P films with thicknesses of a few nanometers are established by analyzing film surface morphology and variation in the film magnetization. It is shown that in the thickness range below 30 nm the polar Kerr effect value θK changes nonmonotonically and depends on a wavelength of the incident light. For the films thicker than 30 nm, this value depends weakly on both the thickness and the wavelength. These features in the θK behavior are attributed to the Faraday effect, which is revealed at small thicknesses upon light reflection from the lower surface of a magnetic layer. It is found that the Faraday effect in the Co–P films exceeds that in the Co films by a factor of more than two. This effect is assumed to be caused by the presence of a Pd underlayer in the samples under study.

► Chemically deposited Co–P films are investigated. ► Features of the polar Kerr effect in these films with thickness from 1 to 50 nm are considered. ► It is shown that the Faraday rotation angle in the Co–P films exceeds that in the Co films by a factor of two. ► Hysteresis loops and magnetization values are presented.

Keywords
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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