| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1800720 | Journal of Magnetism and Magnetic Materials | 2011 | 5 Pages |
A comparative study of the out-of-plane anisotropic magnetoresistance (AMR) in single crystalline and polycrystalline thin films of phase separated manganite Nd0.51Sr0.49MnO3 has been carried out. On-axis DC magnetron sputtering was used to deposit the single crystalline films (30 and 100 nm in thickness) on single crystal (0 0 1) LaAlO3 (LAO) and polycrystalline films (100 nm) on (1 0 0) Yttrium-stabilized ZrO2 (YSZ) substrates. The in-plane and out-of-plane magnetotransport properties of these films differ significantly. A large low field AMR is observed in all the films. AMR shows a peak below the insulator–metal transition temperature in the single crystalline films, while the same increases monotonically in the polycrystalline film. Relatively larger low field AMR (∼20% at T=78 K and H=1.7 kOe) in the polycrystalline films suggests the dominance of the shape anisotropy.
► In plane and out-of-plane LFMR and AMR of Nd0.51Sr0.49MnO3 thin films. ► Magnetic easy axis lies in the plane of all films. ► In-plane and out-of-plane magnetotransport properties differ significantly. ► Large low field AMR in all films. ► Larger low field AMR in the polycrystalline films suggests the dominance of shape anisotropy.
