Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1801680 | Journal of Magnetism and Magnetic Materials | 2010 | 4 Pages |
Abstract
Strontium ferrite (SrM) thin films were deposited on thermally oxidized silicon wafer with Au underlayer. Gold underlayers were prepared at various substrate temperatures by using a magnetron sputtering system. C-axis oriented SrM perpendicular films and preferred (1 1 1) orientation of underlayer have confirmed by X-ray diffraction patterns. The intensity of (1 1 1) diffraction line for Au and that of (0 0 l) diffraction line for strontium ferrite decrease with increase in substrate temperature (Tu) The maximum coercivity and remanent squareness ratio in perpendicular direction, at Tu of 500 °C, are 5.4 kOe and 0.68, respectively. The strength of the intergranular interaction of SrM magnetic particles is described by the parameter Îm. The SrM/Au films prepared at Tu above 100 °C have smaller Îm peak values than that for SrM/Au films prepared at Tu of room temperature. This behavior is related to low magnetostatic coupling between the magnetic particles separated by the non-magnetic amorphous phase.
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Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Arkom Kaewrawang, Ali Ghasemi, Xiaoxi Liu, Akimitsu Morisako,