Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1802378 | Journal of Magnetism and Magnetic Materials | 2008 | 4 Pages |
Abstract
Surface roughness caused by the grain growth of the RuCr non-magnetic intermediate layer (NMIL) was evaluated using the X-ray total reflection method. In the case of Ru NMIL, the value of root mean square roughness of NMIL (Ï) increases from 0.59 to 1.45Â nm with increase in Ar gas pressure and/or thickness of the Ru layer. Judging from the loop slope and normalized coercivity, the degree of magnetic isolation increases as Ï increases, independent of the Cr content of a RuCr NMIL. Furthermore, it was found that Ï of NMIL is strongly correlated with wettability to the seed layer material and is enhanced by the lattice extension of NMIL.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Shinji Yonemura, Shin Saito, Atsushi Hashimoto, Migaku Takahashi,