Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1802437 | Journal of Magnetism and Magnetic Materials | 2007 | 7 Pages |
The influence of annealing on the structure and magnetic properties of amorphous Co/Zr and Co/Hf multilayer films was studied with particular attention to the dependence of the magnetic properties, thermal stability and crystallization process on layer composition and thickness. The temperature at which crystallization commences increases from 400 to 460 °C as the layer thickness dZr or dHf increases from 6 to 18 Å, and decreases from 450 to 400 °C as dCo increases from 12 to 18 Å. Multilayers containing 19–60 at% Zr were studied. The specific magnetization was found to increase even below the temperature at which crystallization commences. Our data are compared with non-multilayer Co–Zr amorphous films and rapidly quenched metallic glasses.