Optimizing head/media electrical characterization in the presence of skew at high track density

The skew angle causes a discrepancy in determining the reader-to-writer offset (RWO) when using different periodical patterns in track profile tests. It also separates the peak overwrite (OW) from the peak high frequency amplitude HFA, (1 T periodical pattern) on corresponding track profiles. Furthermore, higher track density and larger skew angle exacerbate the skew effect and induce more RWO error, thus impacting the parametric performance optimization. Simulation studies are used to interpret the skew effect on the RWO determination and OW cross-track characteristics. Based on experimental investigations and simulation analyses, using the HFA, track profile for deriving the optimal RWO is proposed for spin-stand tests. Actual parametric characterization has proven that the optimal RWO minimized the skew effect and the RWO error, thus improving the parametric performance and reducing the test variation. The method is beneficial and necessary for the high track density characterization.