| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1802669 | Journal of Magnetism and Magnetic Materials | 2006 | 4 Pages |
Abstract
Exchange biased IrMn/NiFe/IrMn thin films were studied as a function of NiFe thickness. In plane angular dependence of a resonance field distribution which is measured by FMR was analyzed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. The unidirectional anisotropic field and the uniaxial anisotropic field were linearly varied with NiFe thickness while the films with a thicker NiFe layer do not follow the linear variation. Resonance field and linewidth variations were also analysed with NiFe thickness.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Yong-Goo Yoo, Seong-Gi Min, Ho-Jun Ryu, Nam-Seok Park, Seong-Cho Yu,