Article ID Journal Published Year Pages File Type
1802952 Journal of Magnetism and Magnetic Materials 2009 4 Pages PDF
Abstract

We present an experimental investigation of the magnetization reversal process in NiFe/Cu(10 nm)/Co circular and elliptical nano-elements with different thickness of the magnetic layers. The results obtained using element sensitive X-ray resonant magnetic scattering (XRMS) were compared with the previous measurements showing that the dipolar interlayer coupling favours the antiparallel alignment of the two magnetization layers at remanance. In the case of circular shape, the increased thickness of the ferromagnetic layers stabilizes the antiparallel alignment of the layers over a wider field range. A similar effect, accompanied by a delay in the onset of the antiparallel alignment, is observed in the case of elliptical nano-elements and applying the external field along the longer axis of the elements, due to the additional shape anisotropy.

Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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