Interface morphologies and magnetization characteristics of Co70Fe30 thin films deposited on conjugated polymer thin films

The surface and interface morphology and magnetization characteristics of Co70Fe30 thin films deposited on bare glass and p-Si/SiO2 substrates and on conjugated polymer poly(3-hexylthiophene-2,5-diyl) (P3HT) thin films on such substrates have been studied by atomic force microscopy and magneto-optic Kerr effect. It was found that the average absolute magnitude of the coercive field of Co70Fe30 correlates with the roughness of the underlayer prior to Co70Fe30 deposition. P3HT deposited on p-Si/SiO2 substrates possesses an increased surface roughness as compared to the p-Si/SiO2 surface, but displays a decreased surface roughness as compared to the one of a bare glass substrate.