Magnetic anisotropy in ilmenite–hematite solid solution thin films grown by pulsed laser ablation

Ferromagnetic thin films of the ilmenite–hematite solid solution Fe2−xTixO3 with x=0.6 and x=0.8 have been grown on (0 0 1) sapphire substrates. X-ray diffraction analysis reveals that the films are single phase with the ilmenite (R3¯) crystal structure. Strong easy-plane anisotropy is observed for the two films, which are nominally n or p type with K1=−8×106 J m−3 for x=0.6 and −11×106 J m−3 for x=0.8 at T=4 K. The trigonal splitting of the 5T2g energy level of Fe2+ is inferred to be 0.11 eV, and the zero-field splitting parameter D to be equal to 15 K.