Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1803888 | Journal of Magnetism and Magnetic Materials | 2008 | 4 Pages |
Abstract
Cubic copper ferrite thin films, obtained by rf sputtering on quartz and subsequent post-annealing and quenching, show a large coercivity of about 300–600 Oe. Stress measurements using X-ray diffraction show high value of stress of about 400–1000 MPa. Both the stress and coercivity are found to increase with the decrease of the thickness of the films. There appears to be a contribution of the stress to the coercivity of the films, in the in-plane M–H loops.
Related Topics
Physical Sciences and Engineering
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Condensed Matter Physics
Authors
M. Ahmad, M. Desai,