Magnetic anisotropy engineering in square magnetic elements

Square magnetic elements with side in the 100-500 nm range have been fabricated using the focused ion beam (FIB) milling technique from a 10 nm thick, single-crystal Fe film, epitaxially grown on MgO(0 0 1). Thanks to the good crystal quality of the film, magnetic elements with well-defined magnetocrystalline anisotropy have been prepared, while the fine control of the size and shape of the magnets allows for the effective engineering of the anisotropic behavior of the magnetostatic energy that determines the so-called configurational anisotropy. Micromagnetic calculations and experiments show that the angular dependence of the transverse susceptibility has a strong dependence on the material parameters as well as on the static applied field. This allows the effective engineering of the total anisotropy of the magnets.