Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1804861 | Journal of Magnetism and Magnetic Materials | 2007 | 5 Pages |
Abstract
CoxFe3âxO4 nanocrystalline films (x=0.2-0.8) on SiO2 substrates were prepared by a sol-gel method. The microstructural and magnetic properties of samples were measured by an X-ray diffractometer (XRD) and a vibrating sample magnetometer (VSM), respectively. Atomic force microscopy (AFM) was used to investigate the surface image of the sample. The measurement results of XRD at room temperature show that the pure spinel structure of the film could be obtained at x=0.8. The magnetic measurements reveal the magnetic properties of the samples depend strongly on Co2+ ions content, and the optimal parameters of the saturation magnetization and coercivity in CoxFe3âxO4films are obtained at x=0.8. Here the coercivity reaches 1.954Â kOe. The average grain sizes of the film are less than 30Â nm obtained from the microscopy images. The situ measurement at high temperatures of range from 293 to 773Â K shows that the microstructures of Co0.8Fe2.2O4 film have good thermal stabilization.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Yan Li, Qingqing Fang, Yanmei Liu, Qingrong Lv, Ping Yin,