Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1805007 | Journal of Magnetism and Magnetic Materials | 2007 | 5 Pages |
Abstract
La0.7Sr0.3MnO3 polycrystalline manganite thin films were grown on silicon (Si) substrates covered by SiOx amorphous native oxide. Curie temperatures of about 325Â K were achieved for 70-nm-thick films. Strong room temperature XMCD signal was detected indicating high spin polarization at the surface. Cross-sectional TEM images show sharp interface between SiOx and manganite without signature of chemical reaction at the interface. Unusual sharp splitting of the manganite film was observed: on the top of a transition layer characterized by low crystalline order, a magnetically robust layer is formed.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
I. Bergenti, V. Dediu, E. Arisi, M. Cavallini, F. Biscarini, C. Taliani, M.P. de Jong, C.L. Dennis, J.F. Gregg, M. Solzi, M. Natali,