Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1805330 | Journal of Magnetism and Magnetic Materials | 2006 | 9 Pages |
Abstract
Switching diagrams of a thin-film 3Ã1 micrometer elliptical permalloy element in a crossed-wire geometry are measured for different pulsed field durations using time-resolved scanning Kerr microscopy. “Astroid”-like diagrams were observed for pulse durations as short as 900Â ps full-width half-maximum. Our study indicates an asymmetry of the switching scenarios and resulting diagrams for positive and negative hard-axis field values, stemming from misalignment of the ellipse major axis with respect to the easy axis of the deposited film. Spatially resolved scans reveal the reluctance to switching of sample edges. The results are compared to Landau-Lifshitz-Gilbert micromagnetic simulations.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
A. Krichevsky, M. Belov, M.R. Freeman,