Article ID Journal Published Year Pages File Type
1808678 Physica B: Condensed Matter 2016 5 Pages PDF
Abstract

Certain characterizations of AlxGa1−xN epilayers require knowledge of the refractive index. Four theoretical models are reviewed, and a simple method to obtain the refractive index n of AlxGa1−xN is proposed. Values of the refractive index obtained at various wavelengths and Al concentrations are compared to the theoretical models, as well as to previously obtained experimental results. Acceptable agreement with both theoretical and experimental values are obtained.

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Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
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