Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1808678 | Physica B: Condensed Matter | 2016 | 5 Pages |
Abstract
Certain characterizations of AlxGa1−xN epilayers require knowledge of the refractive index. Four theoretical models are reviewed, and a simple method to obtain the refractive index n of AlxGa1−xN is proposed. Values of the refractive index obtained at various wavelengths and Al concentrations are compared to the theoretical models, as well as to previously obtained experimental results. Acceptable agreement with both theoretical and experimental values are obtained.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
J.A.A. Engelbrecht, B. Sephton, E. Minnaar, M.C. Wagener,