Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1809660 | Physica B: Condensed Matter | 2014 | 6 Pages |
Abstract
This paper discusses cathodoluminescence detection inside a scanning electron microscope (SEM-CL) for the study of local emission characteristics in phosphors. In this type of instrument, imaging, local element identification as well as cathodoluminescent spectral mapping can be performed. It is shown that with the aid of a beam blanker, local decay time analysis and spectrally resolved decay time mapping can be performed. By correlating simultaneously obtained structural, compositional and luminescence properties, a profound understanding of a phosphor's behavior can be obtained. This is illustrated on Ca2SiS4:Eu, a red-emitting phosphor material of current interest for white light emitting diode (LED) wavelength conversion.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Dirk Poelman, Philippe F. Smet,