| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1809690 | Physica B: Condensed Matter | 2014 | 4 Pages |
Abstract
3C-SiC wafers were irradiated with neutrons of various fluences and at low (200-400 °C) irradiation temperatures. Fourier transform infrared (FTIR) reflectance spectra were obtained for the samples, and the spectra used to extract the dielectric parameters for each specimen, using statistical curve-fitting procedures. Analysis of all data revealed trends in reflectance peak heights as well as in the dielectric parameters. The surface roughness of the irradiated samples was measured by atomic force spectroscopy (AFM) and certain trends could be ascribed to surface roughness.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
J.A.A. Engelbrecht, G. Deyzel, E.G. Minnaar, W.E. Goosen, I.J. van Rooyen,