Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1811413 | Physica B: Condensed Matter | 2011 | 4 Pages |
Abstract
Perovskite manganite La0.9Ba0.1MnO3(LBMO) films were deposited on (0 0 1)-oriented single crystal yttria-stabilized zirconia (YSZ) substrate by 90° off-axis radio frequency magnetron sputtering. The film thickness ranged from 10 nm to 100 nm. Grazing incidence X-ray diffraction technique and high resolution X-ray diffraction were applied to characterize the structure of LBMO films. The LBMO film mainly consisted of (0 0 1)-orientated grain as well as weakly textured (1 1 0)-orientated grain. The results indicated that an amorphous layer with thickness of about 4 nm was formed at the LBMO/YSZ interface. The strain in LBMO film was small and averaged to be about -0.14%. The strain in the film was not lattice mismatch-induced strain but residual strain due to the difference in thermal expansion coefficient between film and substrate.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
W.S. Tan, H.O. Wang, P. Dai, H.P. Wu, X.S. Wu, Q.J. Jia, G.J. Hu, J. Gao,