Relevancy of phase separation between electrical and thermal properties in La0.8Sr0.2MnO3 thin films

For the purpose of finding the relevancy of phase separation between electrical and thermal properties, La0.8Sr0.2MnO3 thin films, deposited on quartz glass substrates, were studied for temperature dependent resistance and thermal emittance. Based on the phase separation concept, metal phase volume fraction f was calculated from the temperature dependence of resistance and emittance properties by a phenomenological model and two-energy-level Boltzmann distribution, respectively. The two sets of f coincide with each other very well. The results show f plays an important role in the electrical transportation and thermal properties, and the two properties are essentially correlated by f.