Article ID Journal Published Year Pages File Type
1812949 Physica B: Condensed Matter 2010 4 Pages PDF
Abstract
The localization length has been derived for one-dimensional bi-layered structures with random perturbations in the refractive indices for each type of layers. Main attention is paid to the comparison between conventional materials and those consisting of mixed right-hand and left-hand materials. It is shown that the localization length is described by the universal expression for both cases. The analytical results are confirmed by numerical simulations.
Related Topics
Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics
Authors
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