Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1815839 | Physica B: Condensed Matter | 2007 | 8 Pages |
Abstract
We report a systematic study on growth of 2% and 4% Samarium (Sm) substituted lead zirconate titanate (PZT) thin films (with molar ratio of Zr:Ti::65/35) by sol gel technique on Pt/Si ã1 0 0ã and Pt/Si ã1 1 1ã substrates. XRD analysis show single phase for all films. Surface morphology was studied using atomic force microscope (AFM). A metal/ferroelectric/metal (MFM) structure was formed by depositing gold electrode on top of the film for electrical measurements (I-V (current vs voltage), C-V (capacitance vs voltage), P-E (polarization vs electric field)). The films show well-defined ferroelectric behaviour for both compositions (2% and 4% Sm-substituted PZT). I-V measurements show a compositional shift along âve (negative) voltage axis. To obtain optical band gap, films were deposited on fused quartz and transmittance measurements were performed. Optical band gap was calculated from (αhÏ
)2 vs hÏ
graph (where α is the extinction coefficient, h the planck's constant and Ï
the frequency of light). The results are discussed.
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
S.K. Pandey, Shiv Kumar, S.N. Chatterjee, Upendra Kumar, Chandra Prakash, Ratnamala Chatterjee, T.C. Goel,