Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1816176 | Physica B: Condensed Matter | 2006 | 4 Pages |
Abstract
Magnetization and electrical resistivity measurements have been performed on a stoichiometric single crystalline magnetite Fe3O4 thin film (thickness of ca. 500Â nm) MBE deposited on MgO (1Â 0Â 0) substrate. The aim of these studies was to check the influence of preparation method and sample form (bulk vs. thin film) on magnetic anisotropy properties in magnetite. The film magnetization along ã0Â 0Â 1ã versus applied magnetic field has been determined both in the direction parallel and perpendicular to the film surface, and at temperatures above and below the Verwey transition. We have found, in agreement with published results, that the in-plane field of 10Â kOe was not sufficient to saturate the sample. This can be understood if some additional factor, on top of the bulk magnetocrystalline anisotropy, is taken into account.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
A. WiecheÄ, J. Korecki, B. Handke, Z. KÄ
kol, D. Owoc, D.A. Antolak, A. KozÅowski,