Nanostructure characterization of Ni and B layers as artificial pinning centers in multilayered MgB2/Ni and MgB2/B superconducting thin films

Article ID	Journal	Published Year	Pages	File Type
1818149	Physica C: Superconductivity and its Applications	2013	8 Pages	PDF

Abstract

âº Nanostructure characterization of Ni and B layers as artificial pinning centers (APCs). âº Relationship between nanostructure and Jc property. âº Enhanced Jc in parallel field by parallel APCs within the MgB2 film.

Keywords

MgB2 Tem Critical current density artificial pinning center Nanostructure

Related Topics

Physical Sciences and Engineering Physics and Astronomy Condensed Matter Physics

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Nanostructure characterization of Ni and B layers as artificial pinning centers in multilayered MgB2/Ni and MgB2/B superconducting thin films

Authors

H. Sosiati, S. Hata, T. Doi, A. Matsumoto, H. Kitaguchi, H. Nakashima,