Growth of bi-axially textured Bi2Sr2Ca1Cu2O8+δ (2 2 1 2) thin films on SrTiO3 substrate by sputtering method

Various applications and fundamental research necessitate the investigation of the effects of in-plane crystal grain boundaries on the transport properties of Bi2Sr2Ca1Cu2O8+δ (2 2 1 2). In this study, an artificial in-plane crystal grain boundary in 2 2 1 2 thin film was prepared by depositing thin films on bi-crystal SrTiO3 substrate. At first, growth conditions of 2 2 1 2 thin films by dc magnetron sputtering were studied; bi-axially textured 2 2 1 2 single phase thin films were then reproducibly prepared on STO substrate. Jc of the thin film was 1 × 105 A/cm2 at 65 K. This value decreased according to the tilt angle of grain boundary.