Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1819204 | Physica C: Superconductivity and its Applications | 2005 | 4 Pages |
Abstract
A simple bridged resonator method is presented for microwave nonlinearity measurement of epitaxial superconductor thin film. By this method, microwave current is concentrated in local bridged part on the resonator, and local inductive and resistive nonlinearity in this part are measured. At the same time, undesired nonlinearity are eliminated from the tested results by the special current distribution of the resonator, which enhances the accuracy of the measured nonlinearity.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Shirong Bu, Zhengxiang Luo, Kai Yang, Bowan Tao,