Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1820402 | Physica C: Superconductivity and its Applications | 2008 | 6 Pages |
Abstract
The surface topography of YBa2Cu3O7âδ thin films deposited on SrTiO3 substrates has been evaluated by atomic force and scanning tunneling microscopy. The observed correlation between the direction of the substrate misorientation and the surface morphology of the films produced is reported: when using substrates with offcut lying only along the [1 0 0] plane, smoother and highly ordered film surfaces are produced, while for substrates misoriented along both the [1 0 0] and [0 1 0] planes, island growth reappears in the resulting films. The findings demonstrate that the direction of substrate offcut influences the morphology of the films deposited, enabling better thin film engineering at nano-scale.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Condensed Matter Physics
Authors
Dimitrios Vassiloyannis, Panos M. Pardalos,