Studies of space charge effects on operating electron beam ion trap at low electron beam energy

An electron beam ion trap (EBIT) is a powerful machine for disentangling studies of atomic processes in plasmas. To assist studies on edge plasma spectroscopic diagnostics, a very low energy EBIT, SH-PermEBIT, has been set up at the Shanghai EBIT lab. Large amounts of simulation works were done to study the factors which hinder the EBIT from operation at very low electron beam energies. Under the guide line of the simulation results, we finally managed to successfully reach 60 eV for the lower end of the electron beam energy with a beam transmission above 57%. In this presentation, simulation studies of the space charge effect, which is one of the most important causes of beam loss, was made based on Tricomp (Field precision).