Area detector corrections for high quality synchrotron X-ray structure factor measurements

Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe2 and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level.