Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1824089 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2012 | 4 Pages |
Abstract
As part of a feasibility study into the use of novel electron detector for X-ray photoelectron emission microscopes (XPEEM) and related methods, we have characterised the imaging performance of a counting Medipix 2 readout chip bump bonded to a Silicon diode array sensor and directly exposed to electrons in the energy range 10-20Â keV. Detective Quantum Efficiency (DQE), Modulation Transfer Function (MTF) and Noise Power Spectra (NPS) are presented, demonstrating very good performance for the case of electrons with an energy of 20Â keV. Significant reductions in DQE are observed for electrons with energy of 15Â keV and less, down to levels of 20% for electrons of 10Â keV.
Keywords
Related Topics
Physical Sciences and Engineering
Physics and Astronomy
Instrumentation
Authors
G. Moldovan, I. Sikharulidze, J. Matheson, G. Derbyshire, A.I. Kirkland, J.P. Abrahams,