| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1824755 | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 2011 | 5 Pages |
Abstract
Recently, CMOS Monolithic Active Pixels Sensors have become strong candidates as pixel detectors to be used in high energy physics experiments. A very good spatial resolution and an excellent detection efficiency could be obtained with these detectors. Beside spatial resolution and detection efficiency, an important parameter to be investigated is the charge collection efficiency (CCE) as a function of the distance from the detector surface. In this paper a new approach to measure the CCE profile by means of ionizing particles is proposed.
Related Topics
Physical Sciences and Engineering
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Instrumentation
Authors
S. Meroli, D. Biagetti, D. Passeri, P. Placidi, L. Servoli, P. Tucceri,